Secondary Ion Mass Spectrometry: Applications for Depth Profiling and Surface Characterization
from $71.16
Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices
from $115.00
Secondary Ion Mass Spectrometry and Its Application to Materials Science
from $114.00
Cluster Secondary Ion Mass Spectrometry: Principles and Applications (Wiley Series on Mass Spectrometry Book 44)
from $110.00
The Practice of Tof-Sims: Time of Flight Secondary Ion Mass Spectrometry
$49.95
from $40.97
Secondary Ion Mass Spectrometry: SIMS IX
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Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications and Trends (Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications)
from $977.87
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
$35.00
from $24.01
Multivariate Data Analysis for Root Cause Analyses and Time-of-Flight Secondary Ion Mass Spectrometry
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Secondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (Sims Six), Palais Des Congre Ve
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