What does secondary ion mass spectrometry mean?
Definitions for secondary ion mass spectrometry
sec·onda·ry ion mass spec·trom·e·t·ry
This dictionary definitions page includes all the possible meanings, example usage and translations of the word secondary ion mass spectrometry.
Wiktionary
secondary ion mass spectrometrynoun
A technique used to visualize the three-dimensional structure of solids by employing an energetic ion beam to fragment the atomic or molecular constituents from a surface
Wikidata
Secondary ion mass spectrometry
Secondary ion mass spectrometry is a technique used in materials science and surface science to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm. Due to the large variation in ionization probabilities among different materials, SIMS is generally considered to be a qualitative technique, although quantitation is possible with the use of standards. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.
Numerology
Chaldean Numerology
The numerical value of secondary ion mass spectrometry in Chaldean Numerology is: 4
Pythagorean Numerology
The numerical value of secondary ion mass spectrometry in Pythagorean Numerology is: 2
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"secondary ion mass spectrometry." Definitions.net. STANDS4 LLC, 2024. Web. 18 Apr. 2024. <https://www.definitions.net/definition/secondary+ion+mass+spectrometry>.
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