What does scanning electron microscope mean?

Definitions for scanning electron microscope
scan·ning elec·tron micro·scope

This dictionary definitions page includes all the possible meanings, example usage and translations of the word scanning electron microscope.

Wiktionary

  1. scanning electron microscopenoun

    An electron microscope whose image is made up of a matrix of points from scanning the surface of a sample.

Wikipedia

  1. Scanning electron microscope

    A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition of the sample. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector (Everhart–Thornley detector). The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. Some SEMs can achieve resolutions better than 1 nanometer. Specimens are observed in high vacuum in a conventional SEM, or in low vacuum or wet conditions in a variable pressure or environmental SEM, and at a wide range of cryogenic or elevated temperatures with specialized instruments.

Wikidata

  1. Scanning electron microscope

    A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, low vacuum and in environmental SEM specimens can be observed in wet conditions. The most common mode of detection is by secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons is a function of the angle between the surface and the beam. On a flat surface, the plume of secondary electrons is mostly contained by the sample, but on a tilted surface, the plume is partially exposed and more electrons are emitted. By scanning the sample and detecting the secondary electrons, an image displaying the tilt of the surface is created.

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Numerology

  1. Chaldean Numerology

    The numerical value of scanning electron microscope in Chaldean Numerology is: 4

  2. Pythagorean Numerology

    The numerical value of scanning electron microscope in Pythagorean Numerology is: 1

Examples of scanning electron microscope in a Sentence

  1. Bertrand Lefebvre:

    It is only when we unpacked and looked at them under the binocular [microscope], back in the laboratory in Lyon, that we could see the soft parts, their presence and identification were then confirmed by SEM (scanning electron microscope) observations and analyses.

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"scanning electron microscope." Definitions.net. STANDS4 LLC, 2024. Web. 19 Mar. 2024. <https://www.definitions.net/definition/scanning+electron+microscope>.

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